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      • EUV Plasma Processes Oscar Versolato
      • Plasma Theory and Modeling John Sheil
      • Ion Interactions Ronnie Hoekstra
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      • EUV Generation & Imaging Stefan Witte Kjeld Eikema
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
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      • Contact Dynamics Bart Weber
      • Materials & Surface Science for EUVL Roland Bliem
      • Materials Theory and Modeling Emilia Olsson
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  • Lianjia Wu PhD defense

    November 30, 2020

    On November 18th PhD student Lianjia Wu obtained the doctorate degree after defending her thesis ‘Metal oxo clusters: molecular design for extreme ultraviolet lithography’ at the University of Amsterdam. The …

  • PhD defense Joris Scheers

    November 13, 2020

    On Tuesday, November 10th, Joris Scheers successfully defended his thesis Charge-state-resolved spectroscopy of multiply-charged tin ions at the Vrije Universiteit Amsterdam. Scheers did his doctoral research in the EUV Plasma …

  • Peter Kraus ‘techniektalent’ of 2020

    November 12, 2020

    Group leader Peter Kraus is one of the fifteen technical talents (Techniektalenten) of 2020 in the Netherlands, that were identified by the Dutch technical journal De Ingenieur. Fundamental science research …

  • Open dag 2020, de online editie, op video

    October 12, 2020

    De jaarlijkse open dag op zaterdag 3 oktober was dit jaar een online editie op ZOOM. Wim Symens (ASML) en Joost Frenken (ARCNL) gaven een lezing over computer- en geheugenchips …

  • New atomic force microscopy system

    October 2, 2020

    The Contact Dynamics group has installed a new commercial Atomic Force Microscopy (AFM) system for the characterization of surface topography and material properties at the nanoscale. The purchased Bruker Innova …

  • Pulsed Laser Deposition for Materials and Surface Science

    September 28, 2020

    In the lab for Materials and Surface Science for EUV Lithography the long awaited setup for thin-film growth using pulsed laser deposition (PLD) has recently been installed. The new setup …

  • ARCNL Working Conditions Survey 2020

    July 24, 2020

    In a well-attended Zoom-session for all employees of ARCNL, Pim Stalenhoef from the company MonitorGroep presented the results of the Working Conditions Survey that his company conducted in May among …

  • Detecting hidden nanostructures by converting light into sound

    July 8, 2020

    Researchers at ARCNL have found a way to detect nanostructures buried under many layers of opaque material, using very high frequency sound waves induced by light. Their findings are promising …

  • ARCNL filling up again

    July 1, 2020

    After several months of strongly reduced presence, due to the corona crisis, 1 July marked the point where ARCNL was back to admitting 50% of its people in the Matrix …

  • The future of metrology is powered by algorithms

    June 30, 2020

    Yesterday, ASML published on their website a very interesting story about Arie den Boef’s research: The future of metrology is powered by algorithms. Den Boef developed YieldStar metrology and is …

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© ARCNL 2025

Logo Logo ARCNL
  • Mission
  • Research
    • Source department

      • EUV Plasma Processes Oscar Versolato
      • Plasma Theory and Modeling John Sheil
      • Ion Interactions Ronnie Hoekstra
    • Metrology department

      • EUV Generation & Imaging Stefan Witte Kjeld Eikema
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
    • Materials department

      • Contact Dynamics Bart Weber
      • Materials & Surface Science for EUVL Roland Bliem
      • Materials Theory and Modeling Emilia Olsson
  • Career
    • Career

      • All vacancies
      • Postdoc vacancies
      • PhD vacancies
      • Scientific internships
      • Support vacancies
    • Career
      • How to apply
      • Coming from abroad
      • Candidate portal
  • More
    • More

      • People
      • News
      • Events
      • Repository
      • Contact & Directions
      • ARCNL Newsletter