Two-dimensional semiconductor films, which can be only atoms thick, are promising materials for next-generation electronic devices. However, challenges with measuring defects in the films have made them difficult to implement …
ARCNL has awarded its new Talent Fellowship for the first time. The fellowship gives MSc graduates the opportunity to develop their own PhD research project together with an ARCNL group …
Paul Ducarme On May 4, joint AMOLF/ARCNL PhD candidate Paul Ducarme successfully defended his thesis, “Harnessing Mechanical Instabilities for Functional Structures Using Nonlinear Building Blocks.” For his doctoral research, Paul …
ARCNL director Marcelo Ackermann has been appointed a joint professor at partner universities University of Amsterdam (UvA) and Vrije Universiteit Amsterdam (VU). He also remains Professor at University of Twente, …
As materials become thinner – now reaching a thickness of single atoms – it has become ever more difficult to create large enough sheets of these materials and transfer them …
On June 17, the people of ARCNL got on a bus to visit their colleagues in the XUV Optics research group at the University of Twente in Enschede. Both XUV …
Dr. Peter Kraus has been awarded an ERC Proof of Concept grant to develop a new metrology technique using high-harmonic generation-driven extreme ultraviolet (EUV) scatterometry. This EUVISION project aims to …
An unexpected observation led Dr. Randy Meijer and collaborators to investigate the formation of microjets in tin droplets. They found that short, consecutive, low-energy laser pulses create shock waves in …
ARCNL researchers have demonstrated the use of high-harmonic generation for scatterometry with nanometer accuracy. This allows them to indirectly measure nanostructures without lenses, using shorter wavelengths of light and faster …
On May 8, researchers from across the Netherlands gathered at Amsterdam Science Park for WomenNetPhysics 2026, the largest Dutch networking event dedicated to strengthening the position of women in physics.
