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News - Nanoscale Imaging and Metrology

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  • Fiber imaging beyond the limits of resolution and speed

    May 8, 2020

    Researchers at ARCNL and Vrije Universiteit Amsterdam have developed a compact setup for fast, super-resolution microscopy through an ultrathin fiber. Using smart signal processing, they beat the theoretical limits of …

  • Lyuba Amitonova starts a new group on Nanoscale Imaging and Metrology

    October 1, 2019

    As of October 1, Lyuba Amitonova has been appointed as a tenure-track group leader at ARCNL. Earlier this year, she has been awarded a WISE grant from NWO supporting her …

  • Dr. Liubov Amitonova appointed as WISE fellow at ARCNL

    May 27, 2019

    NWO has awarded three talented female scientists a WISE grant. Dr. Liubov Amitonova has received an appointment at the Advanced Research Centre for Nanolithography (ARCNL), Dr. Julia Engelmann at the …

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© ARCNL 2021

Logo Logo ARCNL
  • Mission
    • Mission and vision
      • Mission
      • About
  • Research
    • Source department
      • EUV Plasma Processes Oscar Versolato Ronnie Hoekstra Wim Ubachs
    • Metrology department
      • EUV Generation & Imaging Stefan Witte Kjeld Eikema
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
    • Materials department
      • Nanolayers Joost Frenken
      • Contact Dynamics Bart Weber Steve Franklin
      • EUV Photoresists Fred Brouwer (a.i.)
      • Materials and Surface Science for Extreme Ultraviolet Lithography Roland Bliem
      • Nanophotochemistry Fred Brouwer
  • Career
    • Career
      • All vacancies
      • Postdoc vacancies
      • PhD vacancies
      • Scientific internships
      • How to apply
      • Coming from abroad
  • More
    • More
      • People
      • News
      • Events
      • Repository
      • Contact & Directions
      • Newsletter