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News - EUV Photoresists

Category
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  • ARCNL publication selected as 2021 PCCP HOT Article

    August 23, 2021

    Editors and referees of the journal Physical Chemistry Chemical Physics have selected a publication by PhD student Neha Thakur for the journal’s online rolling collection of hottest work. The open …

  • Olivier Lugier defends PhD thesis

    June 15, 2021

    On June 3rd Olivier Lugier successfully defended his thesis ‘Surface-mounted metal-organic frameworks for extreme ultraviolet lithography’at the University of Amsterdam (UvA). Lugier did his doctoral research in the EUV Photoresists …

  • Sonia Castellanos accepts position at Inpria

    January 20, 2020

    Group leader and department head Sonia Castellanos (EUV Photoresists) has been offered a position at the American photoresist company Inpria. Castellanos has accepted the offer and will leave ARCNL by …

  • Prizes for ARCNL students

    September 9, 2019

    Last week two ARCNL students won prizes for their contribution to international conferences. At the ELENA conference in Leuven (Belgium) Neha Thakur got the prize for Best Student Talk. Thakur …

  • Molecular design for nanolithography: The difference is in the details

    July 15, 2019

    HIGHLIGHT ”For the first time, I feel I am doing research that has an impact. It is very rewarding. I am confident that we are developing materials that can be …

  • Teacher and researcher Carin Werner-IJgosse about her experiences at ARCNL

    May 24, 2017

    Once a week high school chemistry teacher Carin Werner-IJgosse works at ARCNL as a researcher in the group EUV Photo resists. She is financially supported by the programme ‘Leraar in …

  • ARCNL welcomes new group leader Sonia Castellanos Ortega

    February 15, 2016

    On February 15th Sonia Castellanos Ortega starts at ARCNL as group leader of the EUV Photoresist Materials group. Castellanos Ortega aims at understanding the mechanisms behind the effects that extreme …

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© ARCNL 2023

Logo Logo ARCNL
  • Mission
    • Mission and vision
      • Mission
      • About
  • Research
    • Source department
      • EUV Plasma Processes Oscar Versolato Wim Ubachs
      • Plasma Theory and Modeling John Sheil
      • Ion Interactions Ronnie Hoekstra
    • Metrology department
      • EUV Generation & Imaging Stefan Witte Kjeld Eikema
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
    • Materials department
      • Contact Dynamics Bart Weber
      • Materials & Surface Science for EUVL Roland Bliem
      • Materials Theory and Modeling Emilia Olsson
  • Career
    • Career
      • All vacancies
      • Postdoc vacancies
      • PhD vacancies
      • Scientific internships
      • Support vacancies
      • How to apply
      • Coming from abroad
  • More
    • More
      • People
      • News
      • Events
      • Repository
      • Contact & Directions
      • Newsletter