dr. Angana Mondal
CV / Biography
Angana Mondal is a Group Leader in the Metrology Department at ARCNL and a MacGillavry Fellow and tenure-track Assistant Professor of Physics at the University of Amsterdam. She leads the Short-Wavelength Light Sources for EUV Metrology group, where her research focuses on the development of tailored extreme-ultraviolet (EUV) and soft X-ray sources from liquids, interfaces, and low-dimensional materials. These systems enable interface-sensitive high-harmonic generation for probing charge transport, interfacial dynamics, and ultrafast reactions, with relevance to semiconductor metrology and nanolithography.
Prior to joining ARCNL and the University of Amsterdam in 2026, Angana Mondal was a postdoctoral researcher at ETH Zürich, where she established liquid-phase high-harmonic spectroscopy as a tool for tracking attosecond electron dynamics in liquids, and solution. She obtained her PhD in Physics in 2020 from the Tata Institute of Fundamental Research (TIFR), India, where her doctoral research focused on intense laser–plasma interactions and the development of compact relativistic electron and hard X-ray sources.
She has received several competitive fellowships and grants, including an SNSF Spark Grant as Principal Investigator and the AoW-InTerMust Fellowship.
