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EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
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Stefan Witte
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Short-Wavelength Light Sources for EUV Metrology
Angana Mondal
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
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Natalia Vakula
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Bas Overvelde
Douwe Honhoff
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Jerry Kamer
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Research Groups
Short-Wavelength Light Sources for EUV Metrology
Ion Interactions
Computational Imaging
Contact Dynamics
EUV Generation & Imaging
EUV Plasma Processes
High-Harmonic Generation & EUV Science
Light-Matter Interaction
Materials & Surface Science for EUVL
Materials Theory and Modeling
Nanoscale Imaging and Metrology
Plasma Theory and Modeling
News
New perspectives on light-induced damage
March 2, 2026
Five ARCNL PhD students defend their theses in one month
February 19, 2026
LOTUS project receives funding to push the limits of optical metrology
February 18, 2026
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Special farewell symposium for Wim van der Zande
March 6, 2026
NNV Plasma Physics symposium
April 1 - 2, 2026
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Mission
Research
Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Short-Wavelength Light Sources for EUV Metrology
Angana Mondal
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
Career
Career
All vacancies
Postdoc vacancies
PhD vacancies
Scientific internships
Support vacancies
Career
How to apply
Coming from abroad
Candidate portal
More
More
People
News
Events
Repository
Contact
ARCNL Newsletter