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EUV Plasma Processes
Oscar Versolato
Ronnie Hoekstra
Wim Ubachs
Metrology department
EUV Generation & Imaging
Stefan Witte
Kjeld Eikema
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Materials department
Nanolayers
Joost Frenken
Contact Dynamics
Bart Weber
Steve Franklin
EUV Photoresists
Fred Brouwer (a.i.)
Materials and Surface Science for Extreme Ultraviolet Lithography
Roland Bliem
Nanophotochemistry
Fred Brouwer
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Fiona Elam
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Priscilla Appiah
Roy van der Linden
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Adam Lassise
Kaj Schokking
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Zhouping Lyu
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Research Groups
Computational Imaging
Contact Dynamics
EUV Generation & Imaging
EUV Photoresists
EUV Plasma Processes
High-Harmonic generation and EUV science
Light-Matter Interaction
Materials & Surface
Science for EUV Lithography
Nanolayers
Nanophotochemistry
Nanoscale Imaging and Metrology
News
The exceptional origin of EUV light in hot tin plasma
May 11, 2020
Fiber imaging beyond the limits of resolution and speed
May 8, 2020
Name change group Paul Planken
May 6, 2020
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Whit Monday 2020
June 1, 2020
Joost Frenken (ARCNL)
June 3, 2020
Exciting tin-oxo cages: light-induced chemistry for nanopatterning
June 3, 2020
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Mission
Mission and vision
Mission
About
Research
Source department
EUV Plasma Processes
Oscar Versolato
Ronnie Hoekstra
Wim Ubachs
Metrology department
EUV Generation & Imaging
Stefan Witte
Kjeld Eikema
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Materials department
Nanolayers
Joost Frenken
Contact Dynamics
Bart Weber
Steve Franklin
EUV Photoresists
Fred Brouwer (a.i.)
Materials and Surface Science for Extreme Ultraviolet Lithography
Roland Bliem
Nanophotochemistry
Fred Brouwer
Career
Career
All vacancies
Postdoc vacancies
PhD vacancies
Scientific internships
How to apply
Coming from abroad
More
More
People
News
Events
Repository
Contact & Directions
