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  • Mission
  • Research
    • Source department

      • EUV Plasma Processes Oscar Versolato
      • Plasma Theory and Modeling John Sheil
      • Ion Interactions Ronnie Hoekstra
    • Metrology department

      • EUV Generation & Imaging Stefan Witte
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
      • Short-Wavelength Light Sources for EUV Metrology Angana Mondal
    • Materials department

      • Contact Dynamics Bart Weber
      • Materials & Surface Science for EUVL Roland Bliem
      • Materials Theory and Modeling Emilia Olsson
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New People

  • Gabija Versekenaite
  • Ylvie Gerritsma
  • Derk Niessink
  • Tom Doeksen
  • Angana Mondal
  • Sakina Zemmouri
  • Jackie Mok
  • Ryan Stevens
  • Bryan Jopoi
View all

Research Groups

  • Short-Wavelength Light Sources for EUV Metrology
  • Ion Interactions
  • Computational Imaging
  • Contact Dynamics
  • EUV Generation & Imaging
  • EUV Plasma Processes
  • High-Harmonic Generation & EUV Science
  • Light-Matter Interaction
  • Materials & Surface Science for EUVL
  • Materials Theory and Modeling
  • Nanoscale Imaging and Metrology
  • Plasma Theory and Modeling

News

  • New measurement technology to further sensing capabilities
    January 13, 2026
  • Harnessing water’s stickiness for adhesion control 
    January 13, 2026
  • Angana Mondal brings a new research group to ARCNL
    January 6, 2026
View all news

Events

  • Viva Fysica 2026
    January 30, 2026
  • Viva Fysica
    January 30, 2026
  • NNV Plasma Physics symposium
    April 1 - 2, 2026
View all events

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  • arcnlsecretariaat@arcnl.nl
  • +31 20 8517100
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© ARCNL 2026

Logo Logo ARCNL
  • Mission
  • Research
    • Source department

      • EUV Plasma Processes Oscar Versolato
      • Plasma Theory and Modeling John Sheil
      • Ion Interactions Ronnie Hoekstra
    • Metrology department

      • EUV Generation & Imaging Stefan Witte
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
      • Short-Wavelength Light Sources for EUV Metrology Angana Mondal
    • Materials department

      • Contact Dynamics Bart Weber
      • Materials & Surface Science for EUVL Roland Bliem
      • Materials Theory and Modeling Emilia Olsson
  • Career
    • Career

      • All vacancies
      • Postdoc vacancies
      • PhD vacancies
      • Scientific internships
      • Support vacancies
    • Career
      • How to apply
      • Coming from abroad
      • Candidate portal
  • More
    • More

      • People
      • News
      • Events
      • Repository
      • Contact
      • ARCNL Newsletter