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R. Hu, S.Yu. Krylov and J.W.M. Frenken,
On the Origin of Frictional Energy Dissipation
,
68
, 8 (2020)
B. Liu, D. Kurilovich, H. Gelderblom and O.O. Versolato,
Mass loss from a stretching semitransparent sheet of liquid tin
, , (2020)
G.S. Jansen,
Wavelength-resolved Extreme Ultraviolet Lensless Imaging and Metrology
, VU University Amsterdam, 2020-01-10
H. Zhang, A. Antoncecchi, S. Edward, I. Setija, P.C.M. Planken and S. Witte,
Unraveling Phononic, Optoacoustic, and Mechanical Properties of Metals with Light-Driven Hypersound
, Phys. Rev. Applied
13
, 1: 014010: 1-14 (2020)
L. Helmbrecht, M. Tan, R. Röhrich, M.H. Bistervels, B.O. Kessels, A.F. Koenderink, B. Kahr and W.L. Noorduin,
Directed Emission from Self‐Assembled Microhelices
, Adv. Funct. Mater., 1908218: 1-5 (2019)
F. Torretti,
Spectroscopy of highly-charged Sn ions for extreme ultraviolet nanolithography
, VU University Amsterdam, 2019-12-19
M. Saedi, C. Cristina Sfiligoj, J. Verhoeven and J.W.M. Frenken,
Effect of rubidium incorporation on the EUV optical properties and intermixing in Mo/Si multilayer mirrors
, Appl.Surf. Sci., 144951: 1-10 (2019)
D. Petrova, B. Weber, C. Allain, P. Audebert, C.H. Venner, A.M. Brouwer and D. Bonn,
Fluorescence microscopy visualization of the roughness-induced transition between lubrication regimes
, Sci.Adv.
5
, 12: eaaw4761: 1-9 (2019)
F. Torretti, F. Liu, M. Bayraktar, J. Scheers, Z. Bouza, W.M.G. Ubachs, R. Hoekstra and O.O. Versolato,
Spectral characterization of an industrial EUV light source for nanolithography
, J. Phys. D: Appl. Phys.
53
, 5: 055204: 1-7 (2019)
