Publications - ARCNL

T. de Faria Pinto, J. Mathijssen, R.A. Meijer, H. Zhang, A. Bayerle, D. Kurilovich, O.O. Versolato, K.S.E. Eikema and S. Witte, Cylindrically and non-cylindrically symmetric expansion dynamics of tin microdroplets after ultrashort laser pulse impact, Appl. Phys. A 127, 2: 93: 1-10 (2021)
O.O. Versolato, L. Behnke, R. Schupp, Z. Bouza, M. Bayraktar, Z. Mazzotta, R.A. Meijer, J. Sheil, S. Witte, W.M.G. Ubachs and R. Hoekstra, Extreme ultraviolet light from a tin plasma driven by a 2-si{micrometer}-wavelength laser, Opt. Express, (2020)
L. Loetgering, S. Witte, X. Liu, A.C.C. de Beurs, M. Du, G. Kuijper and K.S.E. Eikema, Extreme ultraviolet multispectral ptychography with minimum entropy beams, Optica, (2020)
R. Röhrich and A.F. Koenderink, Double moiré localized plasmon structured illumination microscopy, Nanophotonics, (2020)
R. Röhrich, Unconventional metrology: Merging nanophotonics with computational imaging, University of Amsterdam, 2020-12-11
N.J. Schilder, T. A. W. Wolterink, C. Mennes, R. Röhrich and A.F. Koenderink, Phase-retrieval Fourier microscopy of partially temporally coherent nanoantenna radiation patterns, Opt. Express 28, 25: 37844-37859 (2020)
J. Sheil, O.O. Versolato, A.J. Neukirch and J. Colgan, Multiply-excited states and their contribution to opacity in CO2 laser-driven tin-plasma conditions, J. Phys. B: At. At. Mol. Opt. Phys., (2020)
C. Messinis, T.T.M. van Schaijk, N. Pandey, V.T. Tenner, S. Witte, J.F. de Boer and A. den Boef, Diffraction-based overlay metrology using angular-multiplexed acquisition of dark-field digital holograms, Opt. Express 28, 25: 37419-37435 (2020)
L. Wu, Metal oxo clusters: molecular design for extreme ultraviolet lithography, University of Amsterdam, 2020-11-18
H.C. Hendrikse, A. van der Weijden, M. Ronda‐Lloret, T. Yang, R. Bliem, R.N. Shiju, M. van Hecke, L. Li and W.L. Noorduin, Shape‐Preserving Chemical Conversion of Architected Nanocomposites, Adv.Mater., 2003999: 1-7 (2020)

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