Publications - ARCNL

T.N. Hogenelst, C. Leriche, A. Troglia, B. Weber and R. Bliem, Pulsed laser deposition of (TaNbHfTiZr)C high-entropy carbide layers with 38 GPa hardness, Surf. Coat. Technol. 520, 132976: 1-10 (2026)
L. de Wolf, M. Lipp, M. Cochez, A.J. den Boef and L.V. Amitonova, Vision Transformer network for optical overlay metrology on semiconductor wafers, APL Mach. Learn. 4, (1), 016101: 1-10 (2026)
N. Sadegh, J. Haitjema, Y. Zhang, L. Wu, O.C.M. Lugier, I. Bespalov, D. Kazazis, M. Vockenhuber, Y. Ekinci, K. Witte, B. Watts, I. Pollentier, D. De Simone and A.M. Brouwer, Extreme ultraviolet induced reactions of tin–oxo cage photoresists, J. Mater. Chem. C, (2026)
H.T. Çiftçi, J. Cottom, R. Hahury, E. Olsson and B. Weber, Adhesion Control Through Electric Field-Induced Water Adsorption at Oxidized Silicon Interfaces, Tribol. Lett. 74, (1), 4: 1-10 (2026)
S.J.J. de Lange, J. Gonzales, D.J. Engels, F.M. Kohlmeier and J. Sheil, Ion emission properties of tin plasmas generated by 2 µm-wavelength laser pulses, Plasma Sources Sci. Technol. 34, (12), 125013: 1-10 (2025)
F. Bijloo, Dynamic nonlinear light control and metrology with resonant metasurfaces, University of Amsterdam, UvA, 2025-12-17
N. Feldman, Optical Metasurfaces for Information Efficient Nanoscale Metrology, University of Amsterdam, UvA, 2025-12-17
F. Zhang, Methods and Applications of Extreme Ultraviolet Multi-Wavelength Ptychography in Nanoscale Imaging, University of Amsterdam, UvA, 2025-12-11
N. Feldman, A.J. den Boef, L.V. Amitonova and A.F. Koenderink, Information advantage in sensing revealed by Fano-resonant Fourier scatterometry, Nat. Commun. 16, (1), 11388: 1-11 (2025)
R. van der Linden, N. Kuzkova and P.M. Kraus, Nonlinear refractive index measurements of solids and the impact of B-integral on the phase of generated high-order harmonics, Opt. Express 33, (25), 53268: 1-11 (2025)

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