Publications - ARCNL

R. Van Straaten, Measuring the energy spectrum of tin ions from a laser produced plasma in a single shot., Vrije Universiteit Amsterdam, VU, 2025-07-09
T. Bierens, Comparing the simulation thickness profile and expansion curve to those of experiments, Vrije Universiteit Amsterdam, VU, 2025-07-09
T.C. Cromwijk, Advancing overlay metrology using digital holographic microscopy, Vrije Universiteit Amsterdam, VU, 2025-07-03
D.J. Engels, H.K. Schubert, M. Kharbedia, W.M.G. Ubachs and O.O. Versolato, Spectroscopic imaging of tin vapor near plasma threshold, Phys. Rev. Res. 7, (2), 023307: 1-8 (2025)
E. Abram and P.C.M. Planken, Light-induced optical and nanostructural changes of Si gratings, Opt. Express 33, (13), 27839: 1-17 (2025)
K. Pham, Accelerating Lanthanide and Actinide Opacity Calculations with Machine-Learning Models, Vrije Universiteit Amsterdam, VU, 2025-06-19
T.J. van den Hooven, Broadband Optical Detection of Ultrafast Strain Waves in Metals, University of Amsterdam, UvA, 2025-06-16
E. Abram, What is Light-Induced Damage? Pre-ablation regime optical and morphological changes in nanometer thick films and grating structures, University of Amsterdam, UvA, 2025-06-04
M.C. Velsink, M. Illienko, K. Chaudhary and S. Witte, Improving signal-to-noise ratios in pump-probe spectroscopy on light-sensitive samples by adapting pulse repetition rates, Opt. Express 33, (11), 23632-23632 (2025)
M. Illienko, K. Chaudhary, M.C. Velsink and S. Witte, Characterization of Sub-Optical-Wavelength Structures through Optically Opaque Films Using Picosecond Ultrasonics, Nano Lett. 25, (22), 8909-8914 (2025)

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