Publications

D.W. van Baarle, S.Yu. Krylov, M.E.S. Beck and J.W.M. Frenken, On the non-trivial origin of atomic-scale patterns in friction force Microscopy, Tribol Lett 67, 15 (2019)
L. Wu, M. Baliozovic, G. Portale, D. Kazazis, M. Vockenhuber, T. Jung, Y. Ekinci and S. Castellanos, Mechanistic insights in Zr-, and Hf-based molecular hybrid EUV photoresists, J. Micro/Nanolith. MEMS and MOEMS 18, 1 (2019)
Y. Suchorski, M. Datler, I. Bespalov, J. Zeininger, M. Stoeger-Pollach, J. Bernardi, H. Groenbeck and G. Rupprechter, Surface-Structure Libraries: Multifrequential Oscillations in Catalytic Hydrogen Oxidation on Rhodium, J. Phys. Chem. C 123, 7: 4217-4227 (2019)
D. Bodewits and R. Hoekstra, Charge-Exchange Emission from Hydrogen-Like Carbon Ions Colliding with Water Molecules, Atoms 7, 1: 17: 1-11 (2019)
L. Wu, M. Tiekink, A. Giuliani, L. Nahon and S. Castellanos, Tuning photoionization mechanisms of molecular hybrid materials for EUV lithography applications, J.Mater.Chem.C 7, 1: 33-37 (2019)
F.-C. Hsia, D.-M. Tang, W. Jevasuwan, N. Fukata, X. Zhou, M. Mitome, Y. Bando, T.E.M. Nordling and D. Golberg, Realization and direct observation of five normal and parametric modes in silicon nanowire resonators by in situ transmission electron microscopy, Nanoscale Adv. 1, 5: 1784-1790 (2019)
D. Petrova, B. Weber, C. Allain, P. Audebert, D. Bonn and A.M. Brouwer, Fast 3D Microscopy Imaging of Contacts Between Surfaces Using a Fluorescent Liquid, Appl.Mater.Interfaces 10, 48: 40973-40977 (2018)
J. Scheers, A. Ryabtsev, A. Borschevsky, J.C. Berengut, K. Haris, R. Schupp, D. Kurilovich, F. Torretti, A. Bayerle, E. Eliav, W.M.G. Ubachs, O.O. Versolato and R. Hoekstra, Energy-level structure of Sn3+ ions, Phys. Rev. A 98, 6: 062503: 1-12 (2018)
L.S. Dreissen, H.F. Schouten, W.M.G. Ubachs, S.B. Raghunathan and T.D. Visser, Active Two-Dimensional Steering of Radiation from a Nanoaperture, Nano Lett. 18, 11: 7207-7210 (2018)
D.E. Boonzajer Flaes and S. Witte, Interference probe ptychography for computational amplitude and phase microscopy, Opt. Express 26, 24: 31372-31390 (2018)

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