Publications - Proceedings - ARCNL

Q. Evrard, N. Sadegh, C.-C. Hsu, N. Mahne, A. Giglia, S. Nannarone, Y. Ekinci, M. Vockenhuber, A. Nishimura, T. Goya, T. Sugioka and A.M. Brouwer: Influence of the anion in tin-based EUV photoresists properties In: Advances in Patterning Materials and Processes XL, SPIE., 2023.
T.J. van den Hooven, G. de Haan and P.C.M. Planken: Enhancement of acoustic-wave induced reflection changes through surface plasmon polaritons In: Proc. SPIE 12053, Metrology, Inspection, and Process Control XXXVI, 1205305, SPIE., 2022.
X. Liu, L. Loetgering, A.C.C. de Beurs, M. Du, P. Konold, K.S.E. Eikema and S. Witte: Tailoring spatial entropy in extreme ultraviolet focused beams for multispectral ptychography In: Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), 2021, pp. 1-1, IEEE, 2021.
K. Abrashitova and L.V. Amitonova: Sub-Nyquist label-free fiber-based ghost imaging In: 2021 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), IEEE, 2021. - pp. 1-1
Z. Mazzotta, J. Mathijssen, K.S.E. Eikema, O.O. Versolato and S. Witte: TI-REX: A Tunable Infrared laser for Experiments in nanolithography In: , IEEE, 2021.
ZP. Lyu, M.C. Velsink, P.W.H. Pinkse and L.V. Amitonova: Superiority of a Square-core Multimode Fiber for Imaging and Spectroscopy In: Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), 2021, pp. 1-1, IEEE, 2021.
A.C.C. de Beurs, L. Loetgering, M. Herczog, K.S.E. Eikema and S. Witte: aPIE: Angle calibration algorithm for reflection ptychography In: OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), paper CW6B.4, OSA Technical Digest (Optical Society of America), 2021.
C. Messinis, T.T.M. van Schaijk, N. Pandey, A. Koolen, J.F. de Boer, S. Witte and A.J. den Boef: Lens Aberration Calibration and Correction with Plasmonic Nanoparticles in Off-Axis Dark-Field Digital Holographic Microscope for Semiconductor Metrology In: Computational Optical Sensing and Imaging 2021 (COSI), Part of OSA Imaging and Applied Optics Congress 2021, paper CF2E.7, OSA Technical Digest (Optical Society of America), 2021.
A. Pelekanidis, L. Loetgering and S. Witte: Ptychography-based characterization of wavelength-tunable vortex beams In: Computational Optical Sensing and Imaging, COSI 2021 - Part of OSA Imaging and Applied Optics Congress 2021, paper CTu6A.1, OSA Technical Digest (Optical Society of America), 2021.
F. Campi, S.D.C. Roscam Abbing, Z.-Y. Zhang, M.L.S. van der Geest and P.M. Kraus: Efficient extreme-ultraviolet multi-band high-order wave mixing in silica In: Proc. SPIE 11886, International Conference on X-Ray Lasers 2020, SPIE., 2021. - pp. 117-124

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