Logo
Mission
Research
Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Short-Wavelength Light Sources for EUV Metrology
Angana Mondal
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
Career
Career
All vacancies
Postdoc vacancies
PhD vacancies
Scientific internships
Support vacancies
Career
How to apply
Coming from abroad
Candidate portal
More
More
People
News
Events
Repository
Contact
ARCNL Newsletter
Directory
menu
Search
Publications - Articles
Category
Articles
Bachelor Thesis
Book Chapters
Books
Master Thesis
Theses
L. Peng, S. Kooij, H.T. Çiftçi, D. Bonn and B. Weber,
Strong electroadhesion at low voltage enabled by nanoscale roughness
, Phys. Rev. Res.
8
, (3), 033143: 1-7 (2026)
M. Kharbedia, H. França, H.K. Schubert, D.J. Engels, M. Jalaal and O.O. Versolato,
Singular jets in free-falling droplets
, Phys. Rev. Fluids
11
, (7), 073602: 1-21 (2026)
D.B. Dias, G.G. Mentasti, A. Gupta, A. Lambertz, E. Alarcón-Lladó, P. Schall, R. Bliem and J. van de Groep,
Large-Area Deterministic Stamping of 2D Materials on Patterned Surfaces
, ACS Nano
20
, (29), 20611-20622 (2026)
R.A. Meijer, G. Lajoinie, B. Liu, S. Witte and O.O. Versolato,
Controlled interference of laser-induced shock waves in microdroplet jetting
, Phys. Rev. Res.
8
, (2), 023287: 1-7 (2026)
A. Karpavicius, M. Gouder and S. Witte,
High-speed computational imaging achieved by fly-scan ptychography
, Opt. Express
34
, (12), 21563: 1-14 (2026)
A. Tiede, N. Feldman, A. Lambertz, A.F. Koenderink, A. Fontcuberta i Morral and E. Alarcón-Lladó,
Blob detection for photonic metasurface designing: angular and spectral control of scattered light
, Adv. Photonics
8
, (3), 036005: 1-10 (2026)
F. Corazza, E. Kechaoglou, L. Guery, Z. Nie, P. Phadke, C.S. Lehmann, R. Bliem and P.M. Kraus,
Broadband extreme ultraviolet zeroth order scatterometry for nanostructure metrology
, Nat. Commun.
17
, (1) (2026)
M. Gouder, F. Zhang, H.T. Çiftçi, L. Loetgering, K.S.E. Eikema and S. Witte,
Ptychographic imaging ellipsometry with extreme ultraviolet light
, Optica
13
, (5), 959: 1-9 (2026)
N. Feldman, N. de Gaay Fortman, A.J. den Boef, L.V. Amitonova and A.F. Koenderink,
Wavefront Selective Modal Excitations for Optimally Informative Sensing in Fano‐Resonant Metasurfaces
, Nanophotonics
15
, (9), e70119: 1-11 (2026)
N. Kuzkova, P.J. van Essen, R. van der Linden, B. de Keijzer, R.E.F. Silva, A. Jiménez Galán and P.M. Kraus,
Attosecond high-harmonic interferometry probes orbital- and band-dependent dipole phase in magnesium oxide
, Sci. Adv.
12
, (18), eaeb4109: 1-10 (2026)
Logo
Close
Mission
Research
Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Short-Wavelength Light Sources for EUV Metrology
Angana Mondal
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
Career
Career
All vacancies
Postdoc vacancies
PhD vacancies
Scientific internships
Support vacancies
Career
How to apply
Coming from abroad
Candidate portal
More
More
People
News
Events
Repository
Contact
ARCNL Newsletter