June has been a busy month for ARCNL, with a record number of four PhD defenses in one month. The final two defenses took place on June 30th: Cristina Sfiligoj …
On June 9th Mengqi Du successfully defended her thesis ‘Computational Depth-resolved Imaging and Metrology’ at the Vrije Universiteit. Du did her doctoral research in the EUV Generation & Imaging group …
On June 3rd Olivier Lugier successfully defended his thesis ‘Surface-mounted metal-organic frameworks for extreme ultraviolet lithography’at the University of Amsterdam (UvA). Lugier did his doctoral research in the EUV Photoresists …
On April 6th Vanessa Verrina successfully defended her thesis ‘Laser-induced ultrasound for the detection of buried micro- and nano-structures’ at the University of Amsterdam. Verrina did her doctoral research in …
On Wednesday, March 17th PhD student Ruben Schupp defended his thesis ‘Spectral characterization of solid-state laser-driven plasma sources of EUV light’ at the Vrije Universiteit in Amsterdam. Schupp performed …
The journal Applied Physics A has selected a publication from the EUV Generation and Imaging group led by Stefan Witte as this month’s Editor’s Choice. First author Tiago Pinto and …
Extreme Ultraviolet (EUV) light in microscopy offers the advantage of obtaining a high-resolution image combined with spectral information about the object under study. However, because EUV microscopy uses diffraction instead …
In December, the groups of Peter Kraus and Stefan Witte received an Open Technology Programme (OTP) grant for the project ‘Ultrafast metrology of semiconductor nanostructures with a next-generation table-top soft-X-ray …
