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      • EUV Plasma Processes Oscar Versolato
      • Plasma Theory and Modeling John Sheil
      • Ion Interactions Ronnie Hoekstra
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      • EUV Generation & Imaging Stefan Witte
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
      • Short-Wavelength Light Sources for EUV Metrology Angana Mondal
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      • Contact Dynamics Bart Weber
      • Materials & Surface Science for EUVL Roland Bliem
      • Materials Theory and Modeling Emilia Olsson
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News - High-Harmonic Generation and EUV Science

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  • Five ARCNL PhD students defend their theses in one month

    February 19, 2026

    Within one month, five ARCNL PhD students successfully defended their theses. Congratulations to Doctors Dion Engels, Karl Schubert, Fengling Zhang, Falco Bijloo and Nick Feldman! Dion Engels Dion Engels did …

  • LOTUS project receives funding to push the limits of optical metrology

    February 18, 2026

    Anchit Srivastava, postdoctoral researcher at ARCNL, has been awarded an ERC Marie Skłodowska-Curie Actions postdoctoral fellowship for advancing the frontiers of optical metrology. The goal of his LOTUS project is …

  • Shrinking the spotlight: super-resolution microscopy without labels

    January 30, 2026

    ARCNL researchers in the group of Peter Kraus have demonstrated a way to overcome the diffraction limit in optical microscopy, using laser techniques that shape light in both space and …

  • AMOLF-ARCNL PhD collaboration brings to light new nanostructure metrology technique

    October 9, 2025

    The joint PhD program between AMOLF and ARCNL continues to prove its strength in combining fundamental physics with industrial relevance. Falco Bijloo’s research, recently published in ACS Nano, showcases the …

  • All eyes on ARCNL research at European Optical Society Annual Meeting

    September 3, 2025

    ARCNL research had a strong presence at this year's European Optical Society Annual Meeting (EOSAM), with Stefan Witte as general chair, Tamar Cromwijk as a plenary speaker and Peter Kraus …

  • Improving super-resolution microscopy with donut-shaped light and multicolored sources

    November 14, 2024

    Researchers from the High-harmonic generation and EUV science group, led by Peter Kraus, have recently made two groundbreaking advances in the field of high-harmonic generation (HHG). This unlocks new potential …

  • Peter Kraus takes next step towards application with ERC Proof of Concept grant

    July 11, 2024

    The research group of Peter Kraus receives an ERC Proof of Concept grant amounting 150 k€ to bring the innovation of Kraus’ ERC Starting grant on correlated materials closer to …

  • Ultrafast switching with light in correlated materials

    January 23, 2024

    Materials that refuse to fit into theory are often the most fascinating. They challenge researchers to try harder to understand their peculiar behavior, especially when their properties are promising for …

  • NWO Vidi grant for Peter Kraus

    June 29, 2023

    Peter Kraus has received an NWO Vidi grant, which enables him to carry out the project ‘High-harmonic metrology of ultrafast correlated electron dynamics’ (HIMALAYA). Kraus is group leader at ARCNL …

  • NWO-ENW M2 funding for Peter Kraus’ research on strongly correlated materials

    June 27, 2023

    In the NWO-ENW Open Competition M2 call, ARCNL group leader and VU assistant professor Peter Kraus has received funding for a project named ‘Ultrafast X-ray access to strongly correlated designer …

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© ARCNL 2026

Logo Logo ARCNL
  • Mission
  • Research
    • Source department

      • EUV Plasma Processes Oscar Versolato
      • Plasma Theory and Modeling John Sheil
      • Ion Interactions Ronnie Hoekstra
    • Metrology department

      • EUV Generation & Imaging Stefan Witte
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
      • Short-Wavelength Light Sources for EUV Metrology Angana Mondal
    • Materials department

      • Contact Dynamics Bart Weber
      • Materials & Surface Science for EUVL Roland Bliem
      • Materials Theory and Modeling Emilia Olsson
  • Career
    • Career

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      • Postdoc vacancies
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      • Scientific internships
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    • Career
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  • More
    • More

      • People
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