Extreme Ultraviolet (EUV) light in microscopy offers the advantage of obtaining a high-resolution image combined with spectral information about the object under study. However, because EUV microscopy uses diffraction instead …
In December, the groups of Peter Kraus and Stefan Witte received an Open Technology Programme (OTP) grant for the project ‘Ultrafast metrology of semiconductor nanostructures with a next-generation table-top soft-X-ray …
On December 11th, PhD student Ruslan Röhrich successfully defended his thesis ‘Unconventional metrology: merging nanophotonics with computational imaging’ at the University of Amsterdam. Röhrich worked on a joint research project …
Recently, group leader Stefan Witte was interviewed on his research by LaserFocusWorld. You can read the article High-harmonic generation sources enables ultraviolet lensless imaging here.
In the annual article writing competition of the Dutch Journal of Physics (NTvN) former PhD student Matthijs Jansen got second place with his article ‘The color of X-ray radiation’. Jansen …
Controlling the properties of light is of great importance for many areas of physics, including imaging and nanolithography. But for short wavelengths, such as soft-X-ray radiation, such control over especially …
ARCNL group leaders Paul Planken (also full professor at the Institute of Physics at the University of Amsterdam) and Stefan Witte (also associate professor at the department of physics at …
The European Research Council has awarded Stefan Witte with an ERC Consolidator Grant for his proposal entitled “Seeing the invisible: light-based 3D imaging of opaque nanostructures”. Witte is an associate …
At the 2018 Computational Optical Sensing and Imaging conference, ARCNL PhD student Mengqi Du has won the Best Student Paper Award. Du received the prize in recognition of her paper …
Six new ‘Perspectief’ programs have been given the green light by NWO, Netherlands Organisation for Scientific Research. The programs should lead to a new 3D printer for large metal components, …
