Publications - Articles - ARCNL

A. Troglia, Victor Vollema, S. Cassanelli, E. van Heumen, J. van de Groep, A. de Visser and R. Bliem, Tuning material properties via disorder: From crystalline alloy to metallic glass, Mater. Today Phys. 29, 100893: 1-8 (2022)
L. Poirier, D.J. Hemminga, A.C. Lassise, L. Assink, R. Hoekstra, J. Sheil and O.O. Versolato, Strongly anisotropic ion emission in the expansion of Nd:YAG-laser-produced plasma, Phys. Plasmas 29, (12), 123102: 1-11 (2022)
W. Li, K. Abrashitova, G. Osnabrugge and L.V. Amitonova, Generative Adversarial Network for Superresolution Imaging through a Fiber, Phys. Rev. Appl. 18, (3), 034075: 1-9 (2022)
C.-C. Hsu, F.-C. Hsia, B. Weber, M.B. de Rooij, D. Bonn and A.M. Brouwer, Local Shearing Force Measurement during Frictional Sliding Using Fluorogenic Mechanophores, J. Phys. Chem. Lett. 13, (38), 8840-8844 (2022)
P. Antonov, P. Restuccia, M.C. Righi and J.W.M. Frenken, Attractive curves: the role of deformations in adhesion and friction on graphene, Nanoscale Adv. 4, (19), 4175-4184 (2022)
J.A. Wang, Q. Ma, S. Sun, K. Yang, Q. Cai, E. Olsson, X. Chen, Z. Wang, Amr.M. Abdelkader, Y. Li, W. Yan, S. Ding and K. Xi, Highly aligned lithiophilic electrospun nanofiber membrane for the multiscale suppression of Li dendrite growth, eScience 2, (6), 655-665 (2022)
G. Yetik, A. Troglia, S. Farokhipoor, S. van Vliet, J. Momand, B.J. Kooi, R. Bliem and J.W.M. Frenken, Ultrathin, sputter-deposited, amorphous alloy films of ruthenium and molybdenum, Surf. Coat. Technol. 445, 128729: 1-9 (2022)
B. Liu, J. Hernandez-Rueda, H. Gelderblom and O.O. Versolato, Speed of fragments ejected by an expanding liquid tin sheet, Phys. Rev. Fluids 7, (8), 083601: 1-16 (2022)
E. Olsson, J. Cottom, H. Alptekin, H. Au, M. Crespo‐Ribadeneyra, M.M. Titirici and Q. Cai, Investigating the Role of Surface Roughness and Defects on EC Breakdown, as a Precursor to SEI Formation in Hard Carbon Sodium‐Ion Battery Anodes, Small 18, 2200177: 1-12 (2022)
K. Abrashitova and L.V. Amitonova, Multimode fiber ruler for detecting nanometric displacements, APL Photonics 7, (8), 086103: 1-7 (2022)

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