Publications - ARCNL

L. Poirier, Ion diagnostics for Extreme Ultraviolet Nanolithography, VU University Amsterdam, 2023-10-06
F.-C. Hsia, Nanoscale Topography and Wear of Ceramic Interfaces and their effect on Macroscale Friction, University of Amsterdam, 2023-10-06
L. Behnke, Efficient EUV Light Plasma Sources Driven by a 2-μm-Wavelength Laser, VU University Amsterdam, 2023-10-02
Y. Huo, M.K. Espinoza Cangahuala, V. Zamudio-Bayer, M. Goulart, M. Kubin, M. Timm, J.T. Lau, B. von Issendorff, R. Hoekstra, S. Faraji and T. Schlathölter, A comparative laboratory study of soft X-ray-induced ionization and fragmentation of five small PAH cations, Eur. Phys. J. D 77, (10), 181: 1-11 (2023)
M.C. Velsink, M. Illienko, P. Sudera and S. Witte, Optimizing pump–probe reflectivity measurements of ultrafast photoacoustics with modulated asynchronous optical sampling, Rev. Sci. Instrum. 94, (10), 103002: 1-10 (2023)
J. Vandersmissen, R.A. Meijer, J. Sukham, A. Erkelens, A. Jan Bonne and E. Verhagen, Optical readout and actuation of plasmonic nano-optomechanical drum resonators, Opt. Mater. Express 13, (10), 2979-2996 (2023)
N. Sadegh, Spectroscopic investigations of photon-induced reactions in tin-oxo cage photoresists, University of Amsterdam, 2023-09-20
J. Sheil, J. Colgan and O.O. Versolato: Atomic Origins of EUV Light In: Photon Sources for Lithography and Metrology, V. Bakshi, Ed., SPIE Press, Bellingham, Washington, SPIE-Intl Soc Optical Eng, 2023. - pp. 111-148
L. Cruciani, S. van Vliet, A. Troglia, R. Bliem, J.N. van Druten and P.C.M. Planken, Femtosecond laser induced emission of coherent terahertz pulses from ruthenium thin films, , (2023)
C. Leriche, C. Xiao, S.E. Franklin and B. Weber, From atomic attrition to mild wear at multi-asperity interfaces: The wear of hard Si3N4 repeatedly contacted against soft Si, Wear 528-529, 204975: 1-8 (2023)

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