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  • Mission
  • Research
    • Source department

      • EUV Plasma Processes Oscar Versolato
      • Plasma Theory and Modeling John Sheil
      • Ion Interactions Ronnie Hoekstra
    • Metrology department

      • EUV Generation & Imaging Stefan Witte Kjeld Eikema
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
    • Materials department

      • Contact Dynamics Bart Weber
      • Materials & Surface Science for EUVL Roland Bliem
      • Materials Theory and Modeling Emilia Olsson
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  • J. Haitjema, L. Wu, A. Giuliani, L. Nahon, S. Castellanos Ortega and A.M. Brouwer, Photo-Induced Fragmentation of a Tin-Oxo Cage Compound, J. Photopolymer. Sci.Tec. 31, (2), 243-247 (2018)

  • G.S.M. Jansen, A.C.C. de Beurs, X. Liu, K.S.E. Eikema and S. Witte, Diffractive shear interferometry for extreme ultraviolet high-resolution lensless imaging, Opt. Express 26, (10), 12479-12489 (2018)

  • R. Fallica, J. Haitjema, L. Wu, S. Castellanos Ortega, A.M. Brouwer and Y. Ekinci, Absorption coefficient of metal-containing photoresists in the extreme ultraviolet, J. of Micro/Nanolithography. MEMS and MOEMS 17, (2), 023505: 1-7 (2018)

  • B. Weber, Y. Nagata, S. Ketzetzi, F. Tang, W.J. Smit, H.J. Bakker, E.H.G. Backus, D. Bonn and M. Bonn, Molecular Insight into the Slipperiness of Ice, J. Phys. Chem. Lett. 9, (11), 2838-2842 (2018)

  • C.J. Kaplan, P.M. Kraus, A.D. Ross, M. Zürch, S.K. Cushing, M.F. Jager, H.-T. Chang, E.M. Gullikson, D.M. Neumark and S.R. Leone, Femtosecond tracking of carrier relaxation in germanium with extreme ultraviolet transient reflectivity, Phys. Rev. B 97, (20), 205202: 1-9 (2018)

  • R.V. Mom, O. Ivashenko, J.W.M. Frenken, I.M.N. Groot and A.O. Sjastad, Nucleation, Alloying, and Stability of Co–Re Bimetallic Nanoparticles on Al2O3/NiAl(110), J. Phys. Chem. C 122, (16), 8967-8975 (2018)

  • J.L. Ellis, K.M. Dorney, D.D. Hickstein, N.J. Brooks, C. Gentry, C. Hernández-García, D. Zusin, J.M. Shaw, Q.L. Nguyen, C.A. Mancuso, G.S. Jansen, S. Witte, H.C. Kapteyn and M.M. Murnane, High harmonics with spatially varying ellipticity, Optica 5, (4), 479-485 (2018)

  • P.M. Kraus and H.J. Wörner, Perspectives of Attosecond Spectroscopy for the Understanding of Fundamental Electron Correlations, Angew. Chem. Int. Ed. 57, (19), 5228-5247 (2018)

  • A. Bayerle, M.J. Deuzeman, S. van der Heijden, D. Kurilovich, T. de Faria Pinto, A. Stodolna, S. Witte, K.S.E. Eikema, W.M.G. Ubachs, R. Hoekstra and O.O. Versolato, Sn ion energy distributions of ns- and ps-laser produced plasmas, Plasma Sources Sci. Technol. 27, 045001:1-8 (2018)

  • S. Castellanos Ortega, L. Wu, M. Baljozovic, G. Portale, D. Kazazis, M. Vockenhuber, Y. Ekinci and T. Jung: Ti, Zr, and Hf-based molecular hybrid materials as EUV photoresists In: Extreme Ultraviolet (EUV) Lithography IX : SPIE Advanced Lithography, SPIE-Intl Soc Optical Eng, 2018. - pp. 105830A: 1-12 (Proceedings SPIE; 10583)

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© ARCNL 2025

Logo Logo ARCNL
  • Mission
  • Research
    • Source department

      • EUV Plasma Processes Oscar Versolato
      • Plasma Theory and Modeling John Sheil
      • Ion Interactions Ronnie Hoekstra
    • Metrology department

      • EUV Generation & Imaging Stefan Witte Kjeld Eikema
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
    • Materials department

      • Contact Dynamics Bart Weber
      • Materials & Surface Science for EUVL Roland Bliem
      • Materials Theory and Modeling Emilia Olsson
  • Career
    • Career

      • All vacancies
      • Postdoc vacancies
      • PhD vacancies
      • Scientific internships
      • Support vacancies
    • Career
      • How to apply
      • Coming from abroad
      • Candidate portal
  • More
    • More

      • People
      • News
      • Events
      • Repository
      • Contact & Directions
      • ARCNL Newsletter