Publications - ARCNL

A. Schulte, J. Mathijssen, K.S.E. Eikema and S. Witte: Towards High Harmonic Generation in Laser-Produced Plasma In: OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), paper ETh3A.4, OSA Technical Digest (Optical Society of America), 2020.
J. Scheers, Charge-state-resolved spectroscopy of multiply-charged tin ions, VU University Amsterdam, 2020-11-10
S. Rai, K. Bijlsma, S. Koeleman, Tjepkema, A.W. Noordam, H.T. Jonkman, O.O. Versolato and R. Hoekstra, Single-collision scattering of keV-energy Kr ions off a polycrystalline Cu surface, Nucl. Instrum. Methods. Phys. Res., Sect B 482, 58-63 (2020)
A. Antoncecchi, H. Zhang, S. Edward, V. Verrina, P.C.M. Planken and S. Witte, High-resolution microscopy through optically opaque media using ultrafast photoacoustics, Opt. Express 28, (23), 33937-33947 (2020)
V. Verrina, S. Edward, H. Zhang, A. Antoncecchi, S. Witte and P.C.M. Planken, Role of scattering by surface roughness in the photoacoustic detection of hidden micro-structures, Appl. Opt. 59, (30), 9499-9509 (2020)
L. Wu, I. Bespalov, K. Witte, O.C.M. Lugier, J. Haitjema, M. Vockenhuber, Y. Ekinci, B. Watts, A.M. Brouwer and S. Castellanos Ortega, Unravelling the effect of fluorinated ligands in hybrid EUV photoresists by X-ray spectroscopy, J. Mater. Chem. C 8, (42), 14757-14765 (2020)
N. Thakur, R. Bliem, I. Mochi, M. Vockenhuber, Y. Ekinci and S. Castellanos Ortega, Mixed-ligand zinc-oxoclusters: efficient chemistry for high resolution nanolithography, J. Mater. Chem. C 8, (41), 14499-14506 (2020)
H.J. Sielcken and H.J. Bakker, Probing the ultrafast electron and lattice dynamics of gold using femtosecond mid-infrared pulses, Phys. Rev. B 102, (13), 134301: 1-8 (2020)
J. Biemolt, D. van Noordenne, J.W. Liu, E. Antonetti, M. Leconte, S. van Vliet, R. Bliem, G. Rothenberg, X.-Z. Fu and N. Yan, Assembling Palladium and Cuprous Oxide Nanoclusters into Single Quantum Dots for the Electrocatalytic Oxidation of Formaldehyde, Ethanol, and Glucose, ACS Appl. Nano. Mater. 3, (10), 10176-10182 (2020)
R. Röhrich, G. Oliveri, S. Kovaios, V.T. Tenner, A.J. den Boef, J.T.B. Overvelde and A.F. Koenderink, Uncertainty estimation and design optimization of 2D diffraction-based overlay metrology targets, ACS Photonics 7, (10), 2765-2777 (2020)

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