Publications - ARCNL

C.D. Dieleman, Patterning Colloidal Nanocrystals with Light and Electrons, University of Amsterdam, UvA, 2021-06-30
C. Sfiligoj, Towards stable nanolayers for EUV optics, University of Amsterdam, UvA, 2021-06-30
R. Schupp, L. Behnke, Z. Bouza, Z. Mazzotta, Y. Mostafa, A.C. Lassise, L. Poirier, J. Sheil, M. Bayraktar, W.M.G. Ubachs, R. Hoekstra and O.O. Versolato, Characterization of angularly resolved EUV emission from 2-µm-wavelength laser-driven Sn plasmas using preformed liquid disk targets, J. Phys. D: Appl. Phys. 54, (36), 365103: 1-12 (2021)
B. Lochocki, K. Abrashitova, J.F. de Boer and L.V. Amitonova: Resolution limits of compressive imaging via a multimode fiber In: European Conferences on Biomedical Optics 2021 (ECBO), ESIA.5, OSA Technical Digest (Optical Society of America), 2021.
M.V. Verweg, B. Lochocki, J.F. de Boer and L.V. Amitonova: Speckle-Based Super-Resolution Imaging via a Multimode Fiber In: Optics InfoBase Conference Papers, Part of European Conferences on Biomedical Optics, ECBO 2021, paper ES1A.4, OSA Technical Digest (Optical Society of America), 2021.
J. Mathijssen, K.S.E. Eikema and S. Witte: Towards High-Order Harmonic Generation in Laser Produced Plasmas In: Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), 2021, pp. 1-1, IEEE, 2021.
M.C. Velsink, L.V. Amitonova and P.W.H. Pinkse: Towards Multimode-fiber-based Two-photon Endoscopy In: Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), 2021, pp. 1-1, IEEE, 2021.
T.T.M. van Schaijk, C. Messinis, N. Pandey, V.T. Tenner, A. Koolen, S. Witte, J.F. de Boer and A.J. den Boef: Fast and robust diffraction based overlay metrology using dark-field digital holographic microscopy In: Optical Measurement Systems for Industrial Inspection XII, in Proceedings of SPIE, vol 11782, SPIE-Intl Soc Optical Eng, 2021.
E. Sauzeau, Characterization of topography across the scales, Université de Limoges, 2021-06-14
M. Du, Computational Depth-resolved Imaging and Metrology, VU University Amsterdam, 2021-06-09

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