Publications - ARCNL

T.T.M. van Schaijk, C. Messinis, N. Pandey, V.T. Tenner, A. Koolen, S. Witte, J.F. de Boer and A.J. den Boef: Fast and robust diffraction based overlay metrology using dark-field digital holographic microscopy In: Optical Measurement Systems for Industrial Inspection XII, in Proceedings of SPIE, vol 11782, SPIE-Intl Soc Optical Eng, 2021.
E. Sauzeau, Characterization of topography across the scales, Université de Limoges, 2021-06-14
M. Du, Computational Depth-resolved Imaging and Metrology, VU University Amsterdam, 2021-06-09
O.C.M. Lugier, Surface-Mounted Metal-Organic Frameworks for Extreme Ultraviolet Lithography, University of Amsterdam, 2021-06-03
K.J. Flanagan, M. Paradiz Dominguez, Z. Melissari, H.-G. Eckhardt, R.M. Williams, D. Gibbons, C. Prior, G.M. Locke, A. Meindl, A.A. Ryan and M.O. Senge, Structural effects of meso-halogenation on porphyrins, Beilstein J. Org. Chem 17, 1149-1170 (2021)
J. Kirschner, A.H.A. Gomes, R.R.T. Marinho, O. Björneholm, H. Ågren, V. Carravetta, N. Ottosson, A.N. de Brito and H.J. Bakker, The molecular structure of the surface of water–ethanol mixtures, Phys. Chem. Chem. Phys. 23, 11568-11578 (2021)
F.-C. Hsia, F.M. Elam, D. Bonn, B. Weber and S.E. Franklin, Tracing single asperity wear in relation to macroscale friction during running-in, Tribol.Int. 162, 107108: 1-9 (2021)
Y. Zhang, J. Haitjema, S. Castellanos Ortega, O.C.M. Lugier, N. Sadegh, R. Ovsyannikov, E. Giangrisostomi, F.O.L. Johansson, E. Berggren, A. Lindblad and A.M. Brouwer, Extreme ultraviolet photoemission of a tin-based photoresist, Appl. Phys. Lett. 118, (17), 171903: 1-6 (2021)
F.M. Elam, F.-C. Hsia, S. van Vliet, R. Bliem, L. Yang, B. Weber and S.E. Franklin, The influence of corrosion on diamond-like carbon topography and friction at the nanoscale, Carbon 179, 590-599 (2021)
M. Aarts, S. van Vliet, R. Bliem and E. Alarcón-Lladó, Investigation of copper nanoscale electro-crystallization under directed and non-directed electrodeposition from dilute electrolytes, CrystEngComm 23, (20), 3648-3653 (2021)

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