Publications - ARCNL

C. Messinis, M. Adhikary, T. Cromwijk, T.T.M. van Schaijk, S. Witte, J.F. de Boer and A.J. den Boef, Pupil apodization in digital holographic microscopy for reduction of coherent imaging effects, Opt. Continuum 1, (5), 1202-1217 (2022)
O.O. Versolato, J. Sheil, S. Witte, W.M.G. Ubachs and R. Hoekstra, Microdroplet-tin plasma sources of EUV radiation driven by solid-state-lasers (Topical Review), J. Opt. 24, (5), 054014: 1-13 (2022)
X. Yao, E. Olsson, M. Wang, J.A. Wang, Q. Cai, N.H. Peng, R. Webb and Y. Zhao, Xenon Ion Implantation Induced Surface Compressive Stress for Preventing Dendrite Penetration in Solid‐State Electrolytes, Small, 2108124: 1-9 (2022)
A. Troglia, S. van Vliet, G. Yetik, I.El. Wakil, J. Momand, B.J. Kooi and R. Bliem, Free-standing nanolayers based on Ru silicide formation on Si(100), Phys. Rev. Mater. 6, (4), 043402: 1-8 (2022)
A.C.C. de Beurs, L. Loetgering, M. Herczog, M. Du, K.S.E. Eikema and S. Witte, aPIE: an angle calibration algorithm for reflection ptychography, Opt. Lett. 47, (8), 1949-1952 (2022)
M. Meier, J. Hulva, Z. Jakub, F. Kraushofer, M. Bobić, R. Bliem, M. Setvin, M. Schmid, U. Diebold, C. Franchini and G.S. Parkinson, CO oxidation by Pt-2/Fe3O4: Metastable dimer and support configurations facilitate lattice oxygen extraction, Sci. Adv. 8, (13), eabn4580: 1-8 (2022)
A. Antoncecchi, Laser-ultrasonics and imaging through metal layers, VU University Amsterdam, 2022-03-30
N. Thakur, Zinc Oxoclusters for Extreme Ultraviolet Lithography, University of Amsterdam, 2022-03-28
N. Tavakoli, R. Spalding, A. Lambertz, P. Koppejan, G. Gkantzounis, C. Wan, R. Röhrich, E. Kontoleta, A.F. Koenderink, R. Sapienza, M. Florescu and E. Alarcón-Lladó, Over 65% Sunlight Absorption in a 1 μm Si Slab with Hyperuniform Texture, ACS Photonics 9, (4), 1206-1217 (2022)
K. Abrashitova and L.V. Amitonova, High-speed label-free multimode-fiber-based compressive imaging beyond the diffraction limit, Opt. Express 30, (7), 10456-10469 (2022)

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