Publications - ARCNL

M. Adhikary, T.C. Cromwijk, S. Witte, J.F. de Boer and A.J. den Boef: Robust semiconductor overlay metrology with non-uniform illumination beams using digital holographic microscopy In: Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, SPIE-Intl Soc Optical Eng, 2023. - pp. 126180W: 1-6
Y. Mostafa, Z. Bouza, J. Byers, I. Babenko, W.M.G. Ubachs, O.O. Versolato and M. Bayraktar, Extreme ultraviolet broadband imaging spectrometer using dispersion-matched zone plates, Opt. Lett. 48, (16), 4316-4318 (2023)
L. Poirier, A.C. Lassise, R. Hoekstra, J. Sheil and O.O. Versolato, Dependence of ion charge-energy emission from Nd:YAG-laser-produced plasma on laser intensity in the 0.4–40×10^10 W/cm2 range, Phys. Plasmas 30, (8), 083505 : 1-10 (2023)
L. Behnke, E.J. Salumbides, G. Göritz, Y. Mostafa, D.J. Engels, W.M.G. Ubachs and O.O. Versolato, High-energy parametric oscillator and amplifier pulsed light source at 2-μm, Opt. Express 31, (15), 24142-24156 (2023)
G. Yetik, Thermal Stability of Nanolayers for EUV Optics, University of Amsterdam, 2023-07-06
J. Guo, Y. Liu, L. Duan, F. Zhang and C. Xiao, Towards a deeper understanding of temperature-dependent material removal of single-crystal AlN: An atomistic study, Tribol.Int. 185, 108575: 1-10 (2023)
B. Liu, R.A. Meijer, W. Li, J. Hernandez-Rueda, H. Gelderblom and O.O. Versolato, Mass partitioning in fragmenting tin sheets, Phys. Rev. Appl. 20, (1), 014048: 1-18 (2023)
C. Xiao, S. van Vliet, R. Bliem, B. Weber and S.E. Franklin, Electrochemically-stimulated nanoscale mechanochemical wear of silicon, Friction 11, (2023)
W. Li, K. Abrashitova and L.V. Amitonova, Super-resolution multimode fiber imaging with an untrained neural network, Opt. Lett. 48, (13), 3363-3366 (2023)
N. Sadegh, Q. Evrard, N. Mahne, A. Giglia, S. Nannarone and A.M. Brouwer, Electron Generation in Tin-oxo Cage Extreme Ultraviolet Photoresists, J. Photopolym. Sci. Technol. 36, (5), 373-378 (2023)

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