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  • Mission
  • Research
    • Source department

      • EUV Plasma Processes Oscar Versolato
      • Plasma Theory and Modeling John Sheil
      • Ion Interactions Ronnie Hoekstra
    • Metrology department

      • EUV Generation & Imaging Stefan Witte Kjeld Eikema
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
    • Materials department

      • Contact Dynamics Bart Weber
      • Materials & Surface Science for EUVL Roland Bliem
      • Materials Theory and Modeling Emilia Olsson
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  • T. de Faria Pinto, Interactions between ultrashort pulses and laser-produced tin plasmas, VU University Amsterdam, 2023-11-27

  • D.J. Hemminga, Single-fluid radiation-hydrodynamic modeling of laser-driven EUV-emitting plasmas, VU University Amsterdam, 2023-11-20

  • A.C.C. de Beurs, Lensless imaging with high-harmonic sources, VU University Amsterdam, 2023-11-16

  • M.L.S. van der Geest, Extreme-ultraviolet and nonlinear spectroscopy of thin-film functional materials, VU University Amsterdam, 2023-11-15

  • L. Cruciani, S. van Vliet, A. Troglia, R. Bliem, K. van Druten and P.C.M. Planken, Femtosecond Laser-Induced Emission of Coherent Terahertz Pulses from Ruthenium Thin Films, J. Phys. Chem. C 127, (46), 22662-22672 (2023)

  • R.A. Wilhelm, M.J. Deuzeman, S. Rai, W. Husinsky, P.S. Szabo, H. Biber, R. Stadlmayr, C. Cupak, J. Hundsbichler, C. Lemell, M. Möller, A. Mutzke, G. Hobler, O.O. Versolato, F. Aumayr and R. Hoekstra, On the missing single collision peak in low energy heavy ion scattering, Nucl. Instrum. Methods. Phys. Res., Sect B 544, 165123: 1-12 (2023)

  • X. Liu, A. Pelekanidis, M. Du, F. Zhang, K.S.E. Eikema and S. Witte, Observation of chromatic effects in high-order harmonic generation, Phys. Rev. Res. 5, (4), 043100: 1-9 (2023)

  • P.C.M. Laan, E.O. Bobylev, F.J. de Zwart, J.A. Vleer, A. Troglia, R. Bliem, G. Rothenberg, J.N.H. Reek and N. Yan, Tailoring Secondary Coordination Sphere Effects in Single‐metal‐site Catalysts by Surface Immobilization of Supramolecular Cages, Chem. Eur. J., e202301901: 1-7 (2023)

  • J. Sheil, O.O. Versolato, V. Bakshi and H. Scott, Review of the 1st EUV Light Sources Code Comparison Workshop, Atoms 11, (10), 130: 1-18 (2023)

  • F.-C. Hsia, Nanoscale Topography and Wear of Ceramic Interfaces and their effect on Macroscale Friction, University of Amsterdam, 2023-10-06

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© ARCNL 2025

Logo Logo ARCNL
  • Mission
  • Research
    • Source department

      • EUV Plasma Processes Oscar Versolato
      • Plasma Theory and Modeling John Sheil
      • Ion Interactions Ronnie Hoekstra
    • Metrology department

      • EUV Generation & Imaging Stefan Witte Kjeld Eikema
      • Light-Matter Interaction Paul Planken
      • Computational Imaging Arie den Boef
      • High-Harmonic Generation and EUV Science Peter Kraus
      • Nanoscale Imaging and Metrology Lyuba Amitonova
    • Materials department

      • Contact Dynamics Bart Weber
      • Materials & Surface Science for EUVL Roland Bliem
      • Materials Theory and Modeling Emilia Olsson
  • Career
    • Career

      • All vacancies
      • Postdoc vacancies
      • PhD vacancies
      • Scientific internships
      • Support vacancies
    • Career
      • How to apply
      • Coming from abroad
      • Candidate portal
  • More
    • More

      • People
      • News
      • Events
      • Repository
      • Contact & Directions
      • ARCNL Newsletter