Publications - Articles - ARCNL

R. Röhrich, C. Hoekmeijer, C.I. Osorio and A.F. Koenderink, Quantifying single plasmonic nanostructure far -fields with interferometric and polarimetric k-space microscopy, Light : Sci. Appl. 7, 65: 1-11 (2018)
S. Edward, A. Antoncecchi, H. Zhang, H.J. Sielcken, S. Witte and P.C.M. Planken, Detection of periodic structures through opaque metal layers by optical measurements of ultrafast electron dynamics, Opt. Express 26, (18), 23380-23396 (2018)
S.K. Cushing, M. Zürch, P.M. Kraus, L.M. Carneiro, A. Lee, H.-T. Chang, C.J. Kaplan and S.R. Leone, Hot phonon and carrier relaxation in Si(100) determined by transient extreme ultraviolet spectroscopy, Struct. Dyn. 5, (5), 054302: 1-21 (2018)
A. Stodolna, T. de Faria Pinto, F. Ali, A. Bayerle, D. Kurilovich, J. Mathijssen, R. Hoekstra, O.O. Versolato, K.S.E. Eikema and S. Witte, Controlling ion kinetic energy distributions in laser produced plasma sources by means of a picosecond pulse pair, J. Appl. Phys. 124, (5), 053303: 1-7 (2018)
G.C. Dong, Y. Zhang and J.W.M. Frenken, Formation of a monolayer h-BN nanomesh on Rh (111) studied using in-situ STM, Sci. China-Phys. Mech. Astron. 61, (7), 076811: 1-6 (2018)
S.A. Reijers, D. Kurilovich, F. Torretti, H. Gelderblom and O.O. Versolato, Laser-to-droplet alignment sensitivity relevant for laser-produced plasma sources of extreme ultraviolet light, J. Appl. Phys. 124, (1), 013102: 1-7 (2018)
P.M. Kraus, M. Zürch, S.K. Cushing, D.M. Neumark and S.R. Leone, The ultrafast X-ray spectroscopic revolution in chemical dynamics, Nat. Rev. Chem. 2, (6), 82-94 (2018)
Y. Zhang, J. Haitjema, M. Baljozovic, M. Vockenhuber, D. Kazazis, T. Jung, Y. Ekinci and A.M. Brouwer, Dual-tone Application of a Tin-Oxo Cage Photoresist Under E-beam and EUV Exposure, J. Photopolymer. Sci.Tec. 31, (2), 249-255 (2018)
J. Haitjema, L. Wu, A. Giuliani, L. Nahon, S. Castellanos Ortega and A.M. Brouwer, Photo-Induced Fragmentation of a Tin-Oxo Cage Compound, J. Photopolymer. Sci.Tec. 31, (2), 243-247 (2018)
G.S.M. Jansen, A.C.C. de Beurs, X. Liu, K.S.E. Eikema and S. Witte, Diffractive shear interferometry for extreme ultraviolet high-resolution lensless imaging, Opt. Express 26, (10), 12479-12489 (2018)

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