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Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Kjeld Eikema
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
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Publications - EUV Plasma Processes
D.J. Hemminga,
Single-fluid radiation-hydrodynamic modeling of laser-driven EUV-emitting plasmas
, VU University Amsterdam, 2023-11-20
R.A. Wilhelm, M.J. Deuzeman, S. Rai, W. Husinsky, P.S. Szabo, H. Biber, R. Stadlmayr, C. Cupak, J. Hundsbichler, C. Lemell, M. Möller, A. Mutzke, G. Hobler, O.O. Versolato, F. Aumayr and R. Hoekstra,
On the missing single collision peak in low energy heavy ion scattering
, Nucl. Instrum. Methods. Phys. Res., Sect B
544
, 165123: 1-12 (2023)
J. Sheil, O.O. Versolato, V. Bakshi and H. Scott,
Review of the 1st EUV Light Sources Code Comparison Workshop
, Atoms
11
, (10), 130: 1-18 (2023)
Z. Bouza,
Developments for broadband spectral and spatial characterization of tin plasma light sources for EUV lithography
, VU University Amsterdam, 2023-10-06
L. Poirier,
Ion diagnostics for Extreme Ultraviolet Nanolithography
, VU University Amsterdam, 2023-10-06
L. Behnke,
Efficient EUV Light Plasma Sources Driven by a 2-μm-Wavelength Laser
, VU University Amsterdam, 2023-10-02
J. Vandersmissen, R.A. Meijer, J. Sukham, A. Erkelens, A. Jan Bonne and E. Verhagen,
Optical readout and actuation of plasmonic nano-optomechanical drum resonators
, Opt. Mater. Express
13
, (10), 2979-2996 (2023)
J. Sheil, J. Colgan and O.O. Versolato:
Atomic Origins of EUV Light
In:
Photon Sources for Lithography and Metrology, V. Bakshi, Ed., SPIE Press, Bellingham, Washington, SPIE-Intl Soc Optical Eng, 2023. - pp. 111-148
Y. Mostafa, Z. Bouza, J. Byers, I. Babenko, W.M.G. Ubachs, O.O. Versolato and M. Bayraktar,
Extreme ultraviolet broadband imaging spectrometer using dispersion-matched zone plates
, Opt. Lett.
48
, (16), 4316-4318 (2023)
L. Poirier, A.C. Lassise, R. Hoekstra, J. Sheil and O.O. Versolato,
Dependence of ion charge-energy emission from Nd:YAG-laser-produced plasma on laser intensity in the 0.4–40×10^10 W/cm2 range
, Phys. Plasmas
30
, (8), 083505 : 1-10 (2023)
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Mission
Research
Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Kjeld Eikema
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
Career
Career
All vacancies
Postdoc vacancies
PhD vacancies
Scientific internships
Support vacancies
Career
How to apply
Coming from abroad
Candidate portal
More
More
People
News
Events
Repository
Contact & Directions
ARCNL Newsletter