The monthly magazine Laser Focus World recently published a Q&A tutorial about high-harmonic generation. Group Leader Stefan Witte answered various questions on this topic. The interview can be read on …
When used in microscopy applications, extreme ultraviolet (EUV) light can be used for nanoscale imaging that also includes spectral information about the object under study. However, to fully benefit it …
PhD student Alessandro Antoncecchi (EUV Generation and Imaging) successfully defended his thesis 'Laser-ultrasonics and imaging through metal layers' at VU University Amsterdam on March 30th. Promotors are Stefan Witte and …
ARCNL and VU group leader Stefan Witte has been awarded a VICI grant from the Dutch Research Council (NWO), in the domain Applied and Engineering Sciences (TTW), for his project …
ARCNL and VU group leaders Oscar Versolato, Stefan Witte and Wim Ubachs have received funding from the Dutch Research Council (NWO) Open Technology Programme for their project ‘Plasma driven by …
On October 4th Randy Meijer successfully defended his thesis ‘Tailored Laser-Droplet Interaction for Target Formation in Extreme Ultraviolet Sources’ at Vrije Universiteit. Meijer was a PhD student in the group …
On June 9th Mengqi Du successfully defended her thesis ‘Computational Depth-resolved Imaging and Metrology’ at the Vrije Universiteit. Du did her doctoral research in the EUV Generation & Imaging group …
The journal Applied Physics A has selected a publication from the EUV Generation and Imaging group led by Stefan Witte as this month’s Editor’s Choice. First author Tiago Pinto and …
Extreme Ultraviolet (EUV) light in microscopy offers the advantage of obtaining a high-resolution image combined with spectral information about the object under study. However, because EUV microscopy uses diffraction instead …
In December, the groups of Peter Kraus and Stefan Witte received an Open Technology Programme (OTP) grant for the project ‘Ultrafast metrology of semiconductor nanostructures with a next-generation table-top soft-X-ray …
