News

New position for Stefan Witte

Published on September 17, 2024

ARCNL group leader Stefan Witte (EUV Generation & Imaging) has accepted a new position outside ARCNL. He has become professor at Delft University of Technology. Stefan will remain attached to ARCNL as a guest for the time being. This enables him to continue as supervisor of the PhD students in his group. Stefan’s role as head of the Metrology Department will go to Peter Kraus (High Harmonic Generation & EUV Science). He has started as department head on July 1st.

Professorship

Stefan Witt
At TU Delft, Stefan will take up the position of professor of Optics for Nanoscale Metrology, in the Imaging Physics department of the faculty of applied sciences. In this role, he will continue and expand research on new optical imaging technology for visualizing three-dimensional structures at small scales, and explore different application areas. Connecting to the technical physics students and contributing to the optics teaching programs will also be an important part of his new position.

Looking back Stefan says: “I have had a marvelous time at ARCNL. Being part of such a unique institute from the onset, and seeing it grow in size and reputation, has been a great experience. The TU Delft now offers me a different, exciting new opportunity. There is such a wide variety of applied research and engineering in which imaging technology plays a role, and it will be really interesting to connect my research to different fields. Training new generations of scientists and engineers in optics will be important in the coming years, and I am looking forward to that part too. ARCNL has been a great place for me and my group, and I am very thankful to the institute and all the people for creating such a good atmosphere for doing science.”