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Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Short-Wavelength Light Sources for EUV Metrology
Angana Mondal
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
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Publications - Theses
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Theses
C. Messinis,
Dark-Field Digital Holographic Microscopy For Advanced Semiconductor Metrology
, Vrije Universiteit Amsterdam, VU, 2022-11-29
A. Antoncecchi,
Laser-ultrasonics and imaging through metal layers
, Vrije Universiteit Amsterdam, VU, 2022-03-30
N. Thakur,
Zinc Oxoclusters for Extreme Ultraviolet Lithography
, University of Amsterdam, UvA, 2022-03-28
G. de Haan,
Enhanced Generation and Detection of Ultrafast Laser-Induced Acoustic Signals
, University of Amsterdam, UvA, 2022-01-28
R.A. Meijer,
Tailored Laser-Droplet Interaction. For Target Formation in Extreme Ultraviolet Sources
, Vrije Universiteit Amsterdam, VU, 2021-10-04
C. Sfiligoj,
Towards stable nanolayers for EUV optics
, University of Amsterdam, UvA, 2021-06-30
C.D. Dieleman,
Patterning Colloidal Nanocrystals with Light and Electrons
, University of Amsterdam, UvA, 2021-06-30
M. Du,
Computational Depth-resolved Imaging and Metrology
, Vrije Universiteit Amsterdam, VU, 2021-06-09
O.C.M. Lugier,
Surface-Mounted Metal-Organic Frameworks for Extreme Ultraviolet Lithography
, University of Amsterdam, UvA, 2021-06-03
V. Verrina,
Laser-induced ultrasound for the detection of buried micro- and nano-structures
, University of Amsterdam, UvA, 2021-04-06
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Mission
Research
Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Short-Wavelength Light Sources for EUV Metrology
Angana Mondal
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
Career
Career
All vacancies
Postdoc vacancies
PhD vacancies
Scientific internships
Support vacancies
Career
How to apply
Coming from abroad
Candidate portal
More
More
People
News
Events
Repository
Contact
ARCNL Newsletter