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Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Kjeld Eikema
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
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Publications - EUV Generation & Imaging
S. Edward, S. Witte and P.C.M. Planken,
Verborgen uitlijntralies meten met licht en geluid
, NTvN, (2019)
G.S.M. Jansen, X. Liu, K.S.E. Eikema and S. Witte,
Broadband extreme ultraviolet dispersionmeasurements using a high-harmonic source
, Opt. Lett.
44
, (15), 3625-3628 (2019)
R. Schupp, F. Torretti, R.A. Meijer, M. Bayraktar, J. Scheers, D. Kurilovich, A. Bayerle, K.S.E. Eikema, S. Witte, W.M.G. Ubachs, R. Hoekstra and O.O. Versolato,
Efficient generation of extreme ultraviolet light from Nd:YAG-driven microdroplet-tin plasma
, Phys. Rev. Appl.
12
, (1), 014010: 1-11 (2019)
L. Serafini, A. Bacci, A. Bellandi, M. Bertucci, M. Bolognesi, A. Bosotti, F. Broggi, R. Calandrino, F. Camera, F. Canella, S. Capra, P. Cardarelli, M. Carrara, K. Cassou, A. Castoldi, R. Castriconi, G.M. Cattaneo, S. Cialdi, A. Cianchi, N. Coluccelli, C. Curatolo, A. Del Vecchio, S. Di Mitri, I. Drebot, K. Dupraz, A. Esposito, L. Faillace, M. Ferrario, C. Fiorini, C. Galzerano, M. Gambaccini, G. Ghiringhelli, D. Giannotti, D. Giove, F. Groppi, C. Guazzoni, P. Laporta, S. Leoni, A. Loria, P. Mangili, A. Martens, T. Mazza, Z. Mazzotta, C. Meroni, G. Mettivier, P. Michelato, L. Monaco, S. Morante, M.M. Sala, D. Nutarelli, S. Olivares, G. Onida, M. Opromolla, C. Pagani, R. Paparella, M.G.A. Paris, B. Paroli, G. Paterno, C. Paulin, L. Perini, M. Petrarca, V. Petrillo, E. Pinotti, P. Piser, M.A.C. Potenza, F. Prelz, A. Pullia, E. Puppin, F. Ragusa, R. Ramponi, M. Rome, M.R. Conti, A.R. Rossi, L. Rossi, M. Ruijter, P. Russo, S. Samsam, A. Sarno, D. Sertore, M. Sorbi, B. Spataro, M. Statera, G. Turchetti, C. Vaccarezza, R. Valdagni, A. Vanzulli, F. Zomer and G. Rossi,
MariX, an advanced MHz-class repetition rate X-ray source for linear regime time-resolved spectroscopy and photon scattering
, Nucl. Instrum. Methods Phys. Res., Sect. A
930
, (21), 167-172 (2019)
D.E. Boonzajer Flaes,
Reconstructive imaging based on indirect measurements From lensless imaging to waveguide analysis
, VU University Amsterdam, 2019-06-11
D.E. Boonzajer Flaes and S. Witte,
Interference probe ptychography for computational amplitude and phase microscopy
, Opt. Express
26
, (24), 31372-31390 (2018)
S. Edward, A. Antoncecchi, H. Zhang, H.J. Sielcken, S. Witte and P.C.M. Planken,
Detection of periodic structures through opaque metal layers by optical measurements of ultrafast electron dynamics
, Opt. Express
26
, (18), 23380-23396 (2018)
A. Stodolna, T. de Faria Pinto, F. Ali, A. Bayerle, D. Kurilovich, J. Mathijssen, R. Hoekstra, O.O. Versolato, K.S.E. Eikema and S. Witte,
Controlling ion kinetic energy distributions in laser produced plasma sources by means of a picosecond pulse pair
, J. Appl. Phys.
124
, (5), 053303: 1-7 (2018)
G.S.M. Jansen, A.C.C. de Beurs, X. Liu, K.S.E. Eikema and S. Witte,
Diffractive shear interferometry for extreme ultraviolet high-resolution lensless imaging
, Opt. Express
26
, (10), 12479-12489 (2018)
J.L. Ellis, K.M. Dorney, D.D. Hickstein, N.J. Brooks, C. Gentry, C. Hernández-García, D. Zusin, J.M. Shaw, Q.L. Nguyen, C.A. Mancuso, G.S. Jansen, S. Witte, H.C. Kapteyn and M.M. Murnane,
High harmonics with spatially varying ellipticity
, Optica
5
, (4), 479-485 (2018)
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Mission
Research
Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Kjeld Eikema
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
Career
Career
All vacancies
Postdoc vacancies
PhD vacancies
Scientific internships
Support vacancies
Career
How to apply
Coming from abroad
Candidate portal
More
More
People
News
Events
Repository
Contact & Directions
ARCNL Newsletter