Publications - ARCNL

F. Akhmetov, J. Vorberger, I. Milov, I. Makhotkin and M. Ackermann, Ab initio-simulated optical response of hot electrons in gold and ruthenium, Opt. Express 32, (11), 19117-19132 (2024)
L. Cruciani, M. Vreugdenhil, S. van Vliet, E. Abram, D. van Oosten, R. Bliem, K. van Druten and P.C.M. Planken, Direct laser patterning of ruthenium below the optical diffraction limit, Appl. Phys. Lett. 124, (17), 171902 : 1-7 (2024)
E. Abram, I. Milov, N. Orlov, K. van Druten, E.C. Garnett and P.C.M. Planken, Pre-ablation regime light-induced optical changes in nanometer thick metal films, Opt. Express 32, (3), 4564-4587 (2024)
Z. Nie, L. Guery, E.B. Molinero, P. Juergens, T.J. van den Hooven, Y. Wang, A. Jimenez Galan, P.C.M. Planken, R.E.F. Silva and P.M. Kraus, Following the Nonthermal Phase Transition in Niobium Dioxide by Time-Resolved Harmonic Spectroscopy, Phys. Rev. Lett. 131, (24), 243201: 1-7 (2023)
L. Cruciani, S. van Vliet, A. Troglia, R. Bliem, K. van Druten and P.C.M. Planken, Femtosecond Laser-Induced Emission of Coherent Terahertz Pulses from Ruthenium Thin Films, J. Phys. Chem. C 127, (46), 22662-22672 (2023)
L. Cruciani, S. van Vliet, A. Troglia, R. Bliem, J.N. van Druten and P.C.M. Planken, Femtosecond laser induced emission of coherent terahertz pulses from ruthenium thin films, , (2023)
T.J. van den Hooven and P.C.M. Planken, Surface-plasmon-enhanced strain-wave-induced optical diffraction changes from a segmented grating, Photoacoustics 31, 100497: 1-13 (2023)
F. Akhmetov, N. Medvedev, I. Makhotkin, M. Ackermann and I. Milov, Effect of Atomic-Temperature Dependence of the Electron–Phonon Coupling in Two-Temperature Model, Materials 15, (15), 5193: 1-12 (2022)
N. Medvedev and I. Milov, Electron–Phonon Coupling and Nonthermal Effects in Gold Nano-Objects at High Electronic Temperatures, Materials 15, (14), 4883: 1-11 (2022)
T.J. van den Hooven, G. de Haan and P.C.M. Planken: Enhancement of acoustic-wave induced reflection changes through surface plasmon polaritons In: Proc. SPIE 12053, Metrology, Inspection, and Process Control XXXVI, 1205305, SPIE., 2022.

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