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Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Short-Wavelength Light Sources for EUV Metrology
Angana Mondal
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
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Publications - EUV Photoresists
J. Haitjema, S. Castellanos Ortega, O.C.M. Lugier, I. Bespalov, R. Lindblad, M. Timm, C. Bülow, V. Zamudio-Bayer, J.T. Lau, B. von Issendorff, R. Hoekstra, K. Witte, B. Watts, T. Schlathölter and A.M. Brouwer,
Soft X-ray absorption and fragmentation of tin-oxo cage photoresists
, Phys. Chem. Chem. Phys.
26
, (7), 5986-5998 (2024)
N. Sadegh,
Spectroscopic investigations of photon-induced reactions in tin-oxo cage photoresists
, University of Amsterdam, UvA, 2023-09-20
C.-C. Hsu, F.-C. Hsia, B. Weber, M.B. de Rooij, D. Bonn and A.M. Brouwer,
Local Shearing Force Measurement during Frictional Sliding Using Fluorogenic Mechanophores
, J. Phys. Chem. Lett.
13
, (38), 8840-8844 (2022)
N. Thakur,
Zinc Oxoclusters for Extreme Ultraviolet Lithography
, University of Amsterdam, UvA, 2022-03-28
N. Thakur, M. Vockenhuber, Y. Ekinci, B. Watts, A. Giglia, N. Mahne, S. Nannarone, S. Castellanos Ortega and A.M. Brouwer,
Fluorine-Rich Zinc Oxoclusters as Extreme Ultraviolet Photoresists: Chemical Reactions and Lithography Performance
, ACS Mater. Au
2
, (3), 343-355 (2022)
C.D. Dieleman, J.S. van den Burgt, N. Thakur, E.C. Garnett and B. Ehrler,
Direct Patterning of CsPbBr3 Nanocrystals via Electron-Beam Lithography
, ACS Appl. Energy Mater.
5
, (2), 1672-1680 (2022)
M.L.S. van der Geest, N. Sadegh, T.M. Meerwijk, E.I. Wooning, L. Wu, E. Bloem, S. Castellanos Ortega, A.M. Brouwer and P.M. Kraus,
Extreme ultraviolet-excited time-resolved luminescence spectroscopy using an ultrafast table-top high-harmonic generation source
, Rev. Sci. Instrum.
92
, (11), 113004: 1-9 (2021)
L. Wu, M.F. Hilbers, O.C.M. Lugier, N. Thakur, M. Vockenhuber, Y. Ekinci, A.M. Brouwer and S. Castellanos Ortega,
Fluorescent Labeling to Investigate Nanopatterning Processes in Extreme Ultraviolet Lithography
, ACS Appl. Mater. Interfaces
13
, (43), 51790-51798 (2021)
J. Haitjema, L. Wu, A. Giuliani, L. Nahon, S. Castellanos Ortega and A.M. Brouwer,
UV and VUV-induced fragmentation of tin-oxo cage ions
, Phys. Chem. Chem. Phys.
23
, (37), 20909-20918 (2021)
O.C.M. Lugier, N. Thakur, L. Wu, M. Vockenhuber, Y. Ekinci and S. Castellanos Ortega,
Bottom-Up Nanofabrication with Extreme-Ultraviolet Light: Metal–Organic Frameworks on Patterned Monolayers
, ACS Appl. Mater. Interfaces
13
, (36), 43777-43786 (2021)
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Mission
Research
Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Short-Wavelength Light Sources for EUV Metrology
Angana Mondal
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
Career
Career
All vacancies
Postdoc vacancies
PhD vacancies
Scientific internships
Support vacancies
Career
How to apply
Coming from abroad
Candidate portal
More
More
People
News
Events
Repository
Contact
ARCNL Newsletter