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Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Kjeld Eikema
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
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Publications - EUV Plasma Processes
H.L. França, H.K. Schubert, O.O. Versolato and M. Jalaal,
Laser-induced droplet deformation: curvature inversion explained from instantaneous pressure impulse
, J. Fluid Mech.
1020
, A21: 1-29 (2025)
H.K. Schubert, D.J. Engels, M. Kharbedia, H. Gelderblom and O.O. Versolato,
Observation of discrete concentric surface modulations on free-flying liquid tin sheets
, Phys. Fluids
37
, (9), 094108: 1-13 (2025)
R. Van Straaten,
Measuring the energy spectrum of tin ions from a laser produced plasma in a single shot.
, VU University Amsterdam, 2025-07-09
T. Bierens,
Comparing the simulation thickness profile and expansion curve to those of experiments
, VU University Amsterdam, 2025-07-09
D.J. Engels, H.K. Schubert, M. Kharbedia, W.M.G. Ubachs and O.O. Versolato,
Spectroscopic imaging of tin vapor near plasma threshold
, Phys. Rev. Res.
7
, (2), 023307: 1-8 (2025)
,
Development of an experimental setup to study droplet dynamics at micro- and millimeter scale
, University of Groningen, 2025-05-15
E.J. Salumbides, Y. Ezzo, Z. Mazzotta, W.M.G. Ubachs, K.S.E. Eikema, O.O. Versolato and S. Witte,
Arbitrary pulse shaping in a mid-infrared optical parametric oscillator source
, Opt. Express
33
, (10), 20656-20663 (2025)
L. de Reus,
Investigating Tin Vapor Broadening and Shifting Mechanisms for Gas Parameter Extraction Using UV Shadowgraphy
, Eindhoven University of Technology, 2025-04-09
Y. Mostafa,
Mass & Energy Efficient Tin Laser Produced Plasma Light Sources
, VU University Amsterdam, 2025-01-10
O.O. Versolato, I. Kaganovich, K. Bera, T. Lill, H.-C. Lee, R. Hoekstra, J. Sheil and S.K. Nam,
Plasma sources for advanced semiconductor applications
, Appl. Phys. Lett.
125
, (23), 230401: 1-9 (2024)
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Mission
Research
Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Kjeld Eikema
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
Career
Career
All vacancies
Postdoc vacancies
PhD vacancies
Scientific internships
Support vacancies
Career
How to apply
Coming from abroad
Candidate portal
More
More
People
News
Events
Repository
Contact
ARCNL Newsletter