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Oscar Versolato
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John Sheil
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Ronnie Hoekstra
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Stefan Witte
Kjeld Eikema
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
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Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
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Publications - Computational Imaging
F. Bijloo, A.J. den Boef, P.M. Kraus and A.F. Koenderink,
Structure-in-Void Quasi-Bound State in the Continuum Metasurface for Deeply Subwavelength Nanostructure Metrology
, ACS Nano, (2025)
T.C. Cromwijk,
Advancing overlay metrology using digital holographic microscopy
, VU University Amsterdam, 2025-07-03
T.J. van den Hooven,
Broadband Optical Detection of Ultrafast Strain Waves in Metals
, University of Amsterdam, 2025-06-16
M. Noordam, T. van Gardingen-Cromwijk and A.J. den Boef,
Diffraction-based overlay metrology using polarization-resolved dark-field digital holographic microscopy
, J. Micro/Nanopattern. Mater. Metrol.
24
, (01), 014002: 1-13 (2025)
J. Kim, T. van Gardingen-Cromwijk, M. Noordam, M. Adhikary, J.F. de Boer, C. Park, Y. Kang and A.J. den Boef,
Correcting spurious apodization effects in digital holographic microscopy using a simple Fourier transform spectrometer
, Opt. Continuum
4
, (2), 382-395 (2025)
Z. Lyu,
High-resolution Imaging Through a Multimode Fiber: From Raster-scanning to Compressive Sensing
, VU University Amsterdam, 2024-12-11
N. Feldman, K.M.M. Goeloe, A.J. den Boef, L.V. Amitonova and A.F. Koenderink,
Nanometer Interlaced Displacement Metrology Using Diffractive Pancharatnam-Berry and Detour Phase Metasurfaces
, ACS Photonics
11
, (12), 5229-5238 (2024)
T. van Gardingen-Cromwijk, S.G.J. Mathijssen, M. Noordam, S. Witte, J.F. de Boer and A.J. den Boef,
Enhancing diffraction-based overlay metrology capabilities in digital holographic microscopy using model-based signal separation
, J. Micro/Nanopattern. Mater. Metrol.
23
, (4), 044006: 1-14 (2024)
M. Verhage, H.T. Çiftçi, M. Reul, T.C. Cromwijk, T.J.N. van Stralen, B. Koopmans, O. Kurnosikov and K. Flipse,
Switchable-magnetization planar probe MFM sensor for imaging magnetic textures of complex metal oxide perovskite
, J. Appl. Phys.
136
, (18), 184504: 1-10 (2024)
F. Bijloo, K. Murzyn, F. van Emmerik, A.J. den Boef, P.M. Kraus and A.F. Koenderink,
Near-Unity All-Optical Modulation of Third-Harmonic Generation with a Fano-Resonant Dielectric Metasurface
, Nano Lett.
24
, (41), 12942-12947 (2024)
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Mission
Research
Source department
EUV Plasma Processes
Oscar Versolato
Plasma Theory and Modeling
John Sheil
Ion Interactions
Ronnie Hoekstra
Metrology department
EUV Generation & Imaging
Stefan Witte
Kjeld Eikema
Light-Matter Interaction
Paul Planken
Computational Imaging
Arie den Boef
High-Harmonic Generation and EUV Science
Peter Kraus
Nanoscale Imaging and Metrology
Lyuba Amitonova
Materials department
Contact Dynamics
Bart Weber
Materials & Surface Science for EUVL
Roland Bliem
Materials Theory and Modeling
Emilia Olsson
Career
Career
All vacancies
Postdoc vacancies
PhD vacancies
Scientific internships
Support vacancies
Career
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Coming from abroad
Candidate portal
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People
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ARCNL Newsletter