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Nanoscale Imaging and Metrology group focuses on the advanced imaging, sensing and metrology tools. Our ultimate goal is imaging beyond the limits. We are developing new label-free far-field imaging techniques with a spatial resolution beyond …
L. Loetgering, M. Baluktsian, K. Keskinbora, R. Horstmeyer, T. Wilhein, G. Schütz, K.S.E. Eikema and S. Witte, Generation and characterization of focused helical x-ray beams, Sci. Adv. 6, (7), eaax8836: 1-6 (2020)
van Eden, D. Verheijde and J. Verhoeven, Secondary electron emission yield measurements of dielectrics based on a novel collector-only method, Nucl. Instrum. Methods. Phys. Res., Sect B 511, 6-11 (2022)
In a recently published manuscript, researchers in the group of Stefan Witte (ARCNL/ VU) describe a method they developed to perform spectroscopy with Extreme Ultraviolet (EUV) light. The researchers published their findings in the journal …
ARCNL and VU group leader Stefan Witte has been awarded a VICI grant from the Dutch Research Council (NWO), in the domain Applied and Engineering Sciences (TTW), for his project ‘Extreme-ultraviolet nano-imaging with extreme speed …
Do you want to join our group? We regularly have opportunities for research projects in our group, and welcome you to be part of the growing Materials Theory and Modelling group! For PhD or postdoc …
ARCNL group leader Roland Bliem is participating in a consortium that has recently received funding from the NWO Research Infrastructure (RI) call. The project called ‘Shining light on atomic-scale processes’ (SHINE) has a total budget …
