New atomic force microscopy system

The Contact Dynamics group has installed a new commercial Atomic Force Microscopy (AFM) system for the characterization of surface topography and material properties at the nanoscale. The purchased Bruker Innova AFM is particularly suitable for high precision topography measurements and for conductive AFM in which the electrical current that runs through the tip-on-sample interface is measured. Group leader Bart Weber is glad that he can now “measure ultralow currents running through the AFM tip, enabling the nanoscale mapping of the conductivity of samples.”

Since all the groups in the Materials Department are frequent users of AFM, the system has become quite popular at ARCNL.