Kian Goeloe

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CV / Biography

Kian Goeloe received his bachelor’s degree in Engineering Physics at the Fontys University of Applied Sciences in 2020, followed by a (pre-)master’s in Advanced Matter and Energy Physics, a joint-degree program at the University of Amsterdam and the Free University Amsterdam in 2023. He conducted his master’s thesis at AMOLF, which was focused on nanoscale metrology based on symmetry breaking metasurfaces.

In October 2023, he joined the Nanoscale Imaging and Metrology group, led by Dr. Lyuba Amitonova, where his research centers around using optical fibers for metrology.