Event
High Throughput, non-destructive Metrology and Inspection for advance Semiconductor industry
A closed session
Date | 3 April 2024 | Time | 11:00 - 12:00 |
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Location | ARCNL Canteen and Virtual | ||
Speaker | Hamed Sadeghian (Nearfield Instruments, Rotterdam) | ||
Category | Colloquium |
A closed session
© ARCNL 2024