PhD-student: Machine learning for imaging and metrology
As a PhD student, you will develop a Machine Learning framework for high-resolution optical imaging and metrology. You will use the developed methods to image complex wafer metrology targets and to improve the precision of modern methods of alignment and overlay metrology.
You will perform this project together with a team of PhD students and postdocs in the Metrology department at ARCNL. You will be embedded into Nanoscale Imaging and Metrology group and collaborate with researchers from Computational Imaging, EUV Generation and Imaging, and High Harmonic Generation and EUV Science groups. The position will involve close collaboration with researchers of the Amsterdam Machine Learning Lab of UvA, researchers of Vrije University (VU) Amsterdam and researchers at the Dutch semiconductor manufacturing equipment company ASML.
About the group
We are looking for an enthusiastic candidate with an MSc or equivalent degree in physics or mathematics. A background in machine learning, optics and/or computational imaging is a clear advantage. Affinity for solving mathematical problems, large-scale optimization techniques, and working as part of a team are considered important. Good verbal and written communication skills (in English) are required. You will need to meet the requirements for an MSc-degree, to ensure eligibility for a Dutch PhD examination.
Terms of employment
The position is intended as full-time (40 hours / week, 12 months / year) appointment in the service of the Netherlands Foundation of Scientific Research Institutes (NWO-I) for the duration of four years, with a starting salary of gross € 2,539 per month and a range of employment benefits. After successful completion of the PhD research a PhD degree will be granted at Vrije Universiteit Amsterdam (VU). Several courses are offered, specially developed for PhD-students. ARCNL assists any new foreign PhD-student with housing and visa applications and compensates their transport costs and furnishing expenses.
Dr. Lyuba Amitonova
Group leader Nanoscale Imaging and Metrology
Phone: +31 (0)20-754 7100
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– Motivation on why you want to join the group (max. 1 page).
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Applications will be evaluated on a rolling basis and as soon as an excellent match is made, the position will be filled.
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